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Ultra-High-speed, High-accuracy Optical Micrometer

Ultra-High-speed, High-accuracy Optical Micrometer

LS-9000 series

2-Axis Optical Micrometer

2-Axis Optical Micrometer LS-9006D / LS-9030D

THE SENSOR WITHOUT ANY MOVING PARTS ACHIEVES HIGH DURABILITY AND LOW MAINTENANCE

The design includes no moving parts and an LED light source rendering constant calibration due to motor wear and laser degradation unnecessary. The rugged structure and built in air purge units provide stable measurement and inspection for extended periods of time.

Advantage over conventional systems

By eliminating the polygon mirror and motor, both of which are subject to severe wear during normal operation, a structure without any moving parts is achieved. This significantly reduces the maintenance
cost.

Environmental resistance

Equipped with the IP67 rated enclosure and the air purge unit as standard, the LS-9000 Series ensures safe, long-term use in varied environments.

OUTER DIAMETER, CENTRE POSITION, LUMP & NECK DOWN DETECTION CAN BE PROVIDED WITH A SINGLE SYSTEM

The fastest-in-class high-speed sampling at a rate of 16000 samples/sec. and the combination of the delay function and OUT calculation function make it possible for "outer diameter measurement" and "lump and neck down detection" to be performed on a single system, reducing initial and running costs. In the past, each of these required its own system.

Detection algorithm

The LS-9006D/LS-9030D calculates and displays the difference in measured values between two data points on the moving target: data point 1 that is currently being measured and data point 2 that was previously measured. (*Delay function + OUT calculation function)
The small gradual variations in outer diameter can be ignored to detect emergent surface defects only.
[Emergent surface defects = Data point 1 – Data point 2]

Lump and Neck Down detection algorithm

Many times the outer diameter can grow or shrink over time making Lump and Neck Down detection difficult. The LS-9000 Series eliminates this problem by filtering out gradual changes in measurement while measuring the defects.

TYPICAL APPLICATIONS

Measurement of the outer diameter of fine wire: The average outer diameter and centre position of wire can be measured with a high accuracy of ±0.5 μm.

Outer diameter lump and neck down detection at ultra high speed: With the fastest sampling rate in its class of 16000 samples/sec., this micrometer can simultaneously perform both outer diameter measurement and lump and neck down detection at a pitch of around 1 mm on a target travelling down the line at a speed of 1000 m/min.

Outer diameter measurement in harsh environments: With the new revolutionary measurement principle and standard air purge units, accurate measurements are possible in harsh environments.