These technical guides provide information on how both common and hard-to-spot defects (sink marks, warpage, etc.) in surface shape can be easily visualized, measured, and inspected offline to improve process controls.
This system combines eight-color LED illumination with a completely new inspection algorithm. This makes it possible to accurately detect even minor changes in targets regardless of the color, shape, glossiness, or type of the target.
Discover 20 ways that KEYENCE's IM Series can virtually create reference features to solve the most difficult measurement applications. From intersection points to tangent lines this system has the ability to tackle all 2D measurements.